Nova Measuring Instruments Ltd. develops, produces and markets optical metrology solutions. It offers process control metrology systems and stand-alone metrology used in the manufacturing process of semiconductors. Its products include metrology systems for thin film measurement in chemical mechanical polishing and chemical vapor deposition applications; optical and metal line thickness systems for use in post-copper chemical mechanical polishing applications and optical critical dimension systems for lithography and etch applications. The company was founded by Giora Dishon and Moshe Finarov in May 1993 and is headquartered in Ness-Ziona, Israel.